X-RAY DIFFRACTION TECHNIQUES IN MATERIALS CHARACTERISATION

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Learning Outcomes

explain the interactiopn of x-rays with matter.
Defines the properties of x-rays.
Analyses the formation of the continuous spectrum.
Analyses the formation of the characteristic spectrum.
Lists the basic parts of an x-ray tube and explains the formation of x-rays.
relate the size and shape of the unit cell to the directions of diffracted beams.
Analyses the formation of path difference in waves.
Analyses the formation of phase difference in waves.
Relates phase difference to the magnitude of the electric field.
Ananlyses constructive and destructive interference.
Analyses diffraction and the Bragg law.
Defines scattering and diffraction.
Analyses diffraction under ideal and non-ideal conditions.
Calculates particle size ofnano-sized (< 100 nm) crystals via the width of the diffraction peaks at half maximum.
Matches Miller indices with the interplanar spacings.
Will eb able to relate the position of atoms within the unit cell to the intensity of the diffraction peaks.
Analyses the scattering of an x-ray beam by a single free electron.
Analyses the scattering of an x-ray beam by an atom.
Defines the atomic scattering factor and sketches the variation of it as a function of the diffraction angle or the weavelength of the x-ray beam.
Analyses the scattering of an x-ray beam by a unit cell.
formulates and calculates the crystals structure factor.
calculates the number of atoms per unit cell.
Identifies the atomic positions within a unit cell.
Lists the factors that affect the intensity of diffracted beams and anlyses the relationship between these factors and intensity of a diffarcted beam.
identify the crystal structure of inorganic crystalline materials by means of analytical methods.
Indexes diffraction patterns of cubic systems.
Indexes diffraction patterns of tetragonal systems.
Indexes diffraction patterns of hegzagonal systems.
calculate lattice parameters of cubic and non-cubic sistems precisely.
Distinguishes between accuracy and precision.
Applies the method of least squares to the determination of lattice parameters.
Applies Cohen's method to the determination of lattice parameters.
perform chemical analysis on inorganic crstalline matter through employing x-ray diffracxtion techniques.
Qualitatively determines the phases present in one, two or three-phase systems by employing the Hanawalt method.
Quantitatively determines the amount of phases present in two-phase systems by employing the external standard method.
Quantitatively determines the amount of phases present in two-phase systems by employing the direct comparison method.
Quantitatively determines the amount of phases present in two-phase systems by employing the internal standard method.
analyse three-dimensional angular relationships in crystals in two dimensions throughemploying stereographic projection technique.